B32758G2656J000 EPCOS - TDK Electronics
Виробник: EPCOS - TDK Electronics
Description: CAP FILM 65UF 5% 500VDC RADIAL
Packaging: Bulk
Tolerance: ±5%
Package / Case: Radial - 4 Leads
Mounting Type: Through Hole
Operating Temperature: -40°C ~ 105°C
Applications: Automotive
Lead Spacing: 2.067" (52.50mm)
Termination: PC Pins
Ratings: AEC-Q200
Dielectric Material: Polypropylene (PP), Metallized
Voltage Rating - AC: 250V
Voltage Rating - DC: 500V
Height - Seated (Max): 2.244" (57.00mm)
Capacitance: 65 µF
ESR (Equivalent Series Resistance): 1.6 mOhms
Size / Dimension: 2.264" L x 1.772" W (57.50mm x 45.00mm)
Description: CAP FILM 65UF 5% 500VDC RADIAL
Packaging: Bulk
Tolerance: ±5%
Package / Case: Radial - 4 Leads
Mounting Type: Through Hole
Operating Temperature: -40°C ~ 105°C
Applications: Automotive
Lead Spacing: 2.067" (52.50mm)
Termination: PC Pins
Ratings: AEC-Q200
Dielectric Material: Polypropylene (PP), Metallized
Voltage Rating - AC: 250V
Voltage Rating - DC: 500V
Height - Seated (Max): 2.244" (57.00mm)
Capacitance: 65 µF
ESR (Equivalent Series Resistance): 1.6 mOhms
Size / Dimension: 2.264" L x 1.772" W (57.50mm x 45.00mm)
товару немає в наявності
Відгуки про товар
Написати відгук
Технічний опис B32758G2656J000 EPCOS - TDK Electronics
Description: CAP FILM 65UF 5% 500VDC RADIAL, Packaging: Bulk, Tolerance: ±5%, Package / Case: Radial - 4 Leads, Mounting Type: Through Hole, Operating Temperature: -40°C ~ 105°C, Applications: Automotive, Lead Spacing: 2.067" (52.50mm), Termination: PC Pins, Ratings: AEC-Q200, Dielectric Material: Polypropylene (PP), Metallized, Voltage Rating - AC: 250V, Voltage Rating - DC: 500V, Height - Seated (Max): 2.244" (57.00mm), Capacitance: 65 µF, ESR (Equivalent Series Resistance): 1.6 mOhms, Size / Dimension: 2.264" L x 1.772" W (57.50mm x 45.00mm).
Інші пропозиції B32758G2656J000
Фото | Назва | Виробник | Інформація |
Доступність |
Ціна без ПДВ |
---|---|---|---|---|---|
B32758G2656J000 | Виробник : EPCOS / TDK | Film Capacitors 65uF 5% 500VDC AEC-Q200 L/S=52.5mm |
товару немає в наявності |