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74LVC00ABQ-Q100115

74LVC00ABQ-Q100115 NXP USA Inc.


74LVC00A_Q100.pdf Виробник: NXP USA Inc.
Description: IC GATE NAND
Packaging: Bulk
Package / Case: 14-VFQFN Exposed Pad
Mounting Type: Surface Mount
Logic Type: NAND Gate
Operating Temperature: -40°C ~ 125°C
Voltage - Supply: 3.6V
Current - Output High, Low: 24mA, 24mA
Number of Inputs: 2
Supplier Device Package: 14-DHVQFN (2.5x3)
Input Logic Level - High: 1.08V ~ 2V
Input Logic Level - Low: 0.12V ~ 0.8V
Max Propagation Delay @ V, Max CL: 5.1ns @ 3.3V, 50pF
Grade: Automotive
Part Status: Active
Number of Circuits: 4
Current - Quiescent (Max): 40 µA
Qualification: AEC-Q100
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Технічний опис 74LVC00ABQ-Q100115 NXP USA Inc.

Description: IC GATE NAND, Packaging: Bulk, Package / Case: 14-VFQFN Exposed Pad, Mounting Type: Surface Mount, Logic Type: NAND Gate, Operating Temperature: -40°C ~ 125°C, Voltage - Supply: 3.6V, Current - Output High, Low: 24mA, 24mA, Number of Inputs: 2, Supplier Device Package: 14-DHVQFN (2.5x3), Input Logic Level - High: 1.08V ~ 2V, Input Logic Level - Low: 0.12V ~ 0.8V, Max Propagation Delay @ V, Max CL: 5.1ns @ 3.3V, 50pF, Grade: Automotive, Part Status: Active, Number of Circuits: 4, Current - Quiescent (Max): 40 µA, Qualification: AEC-Q100.